- Title:
- Semiconductor contact layer characterization in a context of hall effect measurements
- Authors:
-
Kowalewski, Andrzej
Wróbel, Jarosław
Boguski, Jacek
Gorczyca, Kinga
Martyniuk, Piotr - Subject:
-
metal contact
contact layer
contact resistance
Hall effect
resistivity
van der Pauw method
MSM structure
semiconductors’ characterization - Show more
- Publication date:
- 2019
- Publisher:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Data provider:
- Biblioteka Nauki
Article