Analogue RC model for temperature controller testing

Laboratory tests of temperature control systems are often time consuming processes. This condition results from large time constants of real electrothermal devices. One of possibility of reduction the time value required for tests lays from utility of analogue models. Such models are characterized by possibility to unrestricted formation of time scales of voltage and current wave shapes. According to this advantage, temperature process in real device can be significantly accelerated. In the article the universal Beuken model, coupled with control and recording system implemented in PLC controller was presented. The model can be used in selection of optimal parameters of temperature controller process. The ability of transient characteristics recording and comparing provides ease selection of proper regulator and location of temperature sensor, adapted to specific solution.