Perovskite La1-xSrxFeO3 Thin Films Deposited by Laser Ablation Process

The aim of the research was to investigate the influence of strontium on the structure of thin films La1-xSrxFeO₃ (x = 0; 0,1; 0,2). The LaFeO₃ and Sr-doped LaFeO₃ films were produced by pulsed laser deposition (PLD) on Si (100) substrate using the Nd-YAG (λ = 266 nm) laser. SEM, AFM and XRD methods were used to characterize the structure and morphology of the thin films. X-Ray Diffraction analysis showed only the LaFeO₃ phase in the undoped thin film and the La0.9Sr0.1O3 and La0.8Sr0.2O₃ phases in thin films doped by Sr. The mean crystallite size, calculated by Williamson-Hall method, was smaller (of the order of 18 nm) in films doped by Sr. SEM analysis showed small droplets in thin films doped by Sr. Highly developed surface layer was observed using the AFM microscope for thin films doped by Sr.